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Título del libro: Ferroelectrics: New Research
Título del capítulo: The nanoscale ferroelectric behavior of gesbte films studied by piezoresponse force microscopy

Autores UNAM:
JOSE JUAN GERVACIO ARCINIEGA;

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Autores externos:

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Idioma:
Inglés

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Año de publicación:
2012

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Resumen:

Ferroelectric materials offer a wide range of useful properties to develop applications for the electronic engineer. The tendency to develop smaller ferroelectric devices implies to have a deep understanding of ferroelectric materials properties at the nanoscale level. Piezoresponse force microscopy (PFM) in a scanning probe microscopy mode (SPM), shows to be an ideal non-destructive technique to study the nanoscale behavior of ferroelectric materials due to its high resolution in the range of nanometers and to its ability to manipulate ferroelectric domains. An improvement of this technique developed to investigate ferroelectric materials with small piezoelectric coefficient is the use of contact resonance PFM, which allows an amplification of the piezoresponse signal in proportion to the Q-value (10-100) of the cantilever-sample contact resonance. Moreover, switching spectroscopy PFM allows hysteresis loop measurements in a local domain achieving quantitative information about the switching processes at nanoscale resolution, including coercive bias and work of switching. The first part of this chapter will be a brief description about the principles, theoretical background, recent developments and applications of piezoresponse force microscopy. Furthermore, a new development of PFM will be described for the investigation of chalcogenide thin films, GeSbTe alloys, which have application in data storage memory. These alloys are non-typical ferroelectric materials with low electrical resistivity, which make difficult to investigate their ferroelectric properties by other conventional techniques. Different characterization techniques were employed to study GeTe, Ge4Sb1Te5 and Ge2Sb2Te5 thin films: contact resonance PFM and switching spectroscopy PFM for the investigation of ferroelectric domain structure and impedance spectroscopy technique to obtain Curie temperatures. Because of their ferroelectric properties, these chalcogenide materials can find applications in the super-resolution optical disks where the resolution is far smaller than the diffraction limit, for achieving ultrahigh storage density. © 2012 by Nova Science Publishers, Inc. All rights reserved.

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Entidades citadas de la UNAM:

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Fuente:


ISBN:
9781619422827
Editorial:
Nova Science Publishers, Inc. Nombre de la publicación:
The nanoscale ferroelectric behavior of gesbte films studied by piezoresponse force microscopy
Página inicial:
207
Página final:
228

Tipo de producto:
Capítulo de un Libro